Defect recognition and image processing in semiconductors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997
edited by J. Donecker and I. Rechenberg
Bok Engelsk 1998 International Conference on Defect Recognition and Image Processing in Semiconductors
| Utgitt | Bristol : Institute of Physics Publ. , c1998
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| Omfang | XX, 524 s. : ill.
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| Emner | |
| ISBN | 0750305002
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