Optical metrology : proceedings of a conference held 18-19 July 1999, Denver, Colorado
Ghanim A. Al-Jumaily, editor ; sponsored by SPIE - the International Society for Optical Engineering
Bok Engelsk 1999
| Utgitt | Bellingham, Wash. : SPIE Optical Engineering Press , c1999
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|---|---|
| Omfang | VI, 276 s. : ill.
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| Emner | |
| ISBN | 0819432350
|
