Electron microscopy and analysis
Peter J. Goodhew, John Humphreys, Richard Beanland.
Bok Engelsk 2001 · Electronic books.
| Medvirkende | |
|---|---|
| Omfang | 1 online resource (262 p.)
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| Utgave | 3rd ed.
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| Opplysninger | Description based upon print version of record.. - Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction. - The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu. - Electron microscopy is the process of greatly magnifying tiny particles in order to see and analyse them. An essential undergraduate textbook and laboratory manual for those working/studying in physics, chemistry, and the biological sciences
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| Emner | |
| Sjanger | |
| Dewey | |
| ISBN | 0-203-18425-4. - 0-429-17625-2. - 1-282-77797-1. - 1-4200-1725-X. - 1-4822-8934-2. - 9786612777974
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