Testing and reliable design of CMOS circuits

by Niraj K. Jha and Sandip Kundu
Bok · Språk ikke angitt · 1990

Utgitt	Boston : Kluwer , c1990
Omfang	xii, 231 s. : ill.
Emner	Integrated circuits - Very large scale integration Design and construction Metal oxide semiconductors, Complimentary - Reliability Metal oxide semiconductors, Complimentary - Testing Halvlederkomponenter Vis mer... Integrerte kretser - Prøving MOS-teknikk
ISBN	0792390563